Probabilistic models to assist maintenance of multiple instruments
dc.contributor.author
dc.date.accessioned
2010-06-18T08:41:52Z
dc.date.available
2010-06-07T12:29:04Z
2010-06-18T08:41:52Z
dc.date.issued
2009
dc.identifier.citation
Meléndez, J., López, B., i Millán-Ruiz, D. (2009). Probabilistic models to assist maintenance of multiple instruments. IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 1-4. Recuperat 18 juny 2010, a http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5347263
dc.identifier.isbn
978-1-4244-2727-7
dc.identifier.issn
1946-0759
dc.identifier.uri
dc.description.abstract
The paper discusses maintenance challenges of organisations with a huge number of devices and proposes the use of probabilistic models to assist monitoring and maintenance planning. The proposal assumes connectivity of instruments to report relevant features for monitoring. Also, the existence of enough historical registers with diagnosed breakdowns is required to make probabilistic models reliable and useful for predictive maintenance strategies based on them. Regular Markov models based on estimated failure and repair rates are proposed to calculate the availability of the instruments and Dynamic Bayesian Networks are proposed to model cause-effect relationships to trigger predictive maintenance services based on the influence between observed features and previously documented diagnostics
dc.format.mimetype
application/pdf
dc.language.iso
eng
dc.publisher
IEEE
dc.relation.isformatof
Reproducció digital del document publicat a: http://dx.doi.org/10.1109/ETFA.2009.5347263
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© IEEE Conference on Emerging Technologies & Factory Automation : 2009 : ETFA 2009, 2009, p. 1-4
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Articles publicats (D-EEEiA)
dc.rights
Tots els drets reservats
dc.subject
dc.title
Probabilistic models to assist maintenance of multiple instruments
dc.type
info:eu-repo/semantics/article
dc.rights.accessRights
info:eu-repo/semantics/openAccess
dc.identifier.doi